MIL-T-46238E (MU)
4.3.2.9 Test set, M40 (see dwg. 8800950).
Categories
Defects
Method of
Code No.
Inspection
Critical:
None defined.
Major:
AQL 0.40 percent
101.
Component improperly assembled,
09001
102.
Evidence of insufficient
potting (not flush)
09003
Minor:
AQL 1.0 percent
2010
Marking misleading or
09004
202.
Evidence of poor workmanship
09005
4.3.2.10 Carton, sealed (see section 5).
Categories
Defects
Method of
Code No.
Inspection
Critical:
None defined.
Major:
AQL 0.40 percent
101.
Assembly damaged so that
contents are exposed or
10001
102.
Sealing strip incomplete,
badly wrinkled, or not in
full contact with surface
around entire carton
10002
Minor:
AQL 1.0 percent
201.
Contents move when carton
is shaken
10003
202.
Marking misleading or
unidentifiable
10004
4.3.3 Testing
4.3.3.1 Resistance of resistor - Major defect - Code No.
11001 (see dwg, 9207841). Fifty (50) resistors shall be selected
from each lot for test. The lot shall be rejected if any resistor
fails to comply with the requirements. The test shall be performed
as specified in 4.4.1 using test equipment in accordance with 4.3.4.
(non-destructive)
10
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